DISCHARGE CHARACTERISTICS FOR MAGNETRON SPUTTERING OF AL IN AR AND AR-O-2 MIXTURES

被引:133
作者
MANIV, S [1 ]
WESTWOOD, WD [1 ]
机构
[1] BELL NO RES,BOX 3511,OTTAWA K1Y 4H7,ONTARIO,CANADA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1980年 / 17卷 / 03期
关键词
D O I
10.1116/1.570553
中图分类号
O59 [应用物理学];
学科分类号
摘要
An Al target has been sputtered in a planar magnetron system using argon and argon-oxygen mixtures at pressures from 0. 1 to 2 Pa. The characteristics of both dc and rf discharges have been investigated. In the dc case, the current is given by a relation of the form KV**n where V is the applied voltage and K and n are pressure-dependent parameters. Values of n p to 9 were obtained at the higher pressures but n decreased at lower pressures. For the rf discharge, the target self-bias voltage, V//s//b, at a given power decreased with decreasing pressure and was related to the average rf power by a relationship of the form CV//s//b/(V//s//b minus V) where V was approximately 1000 V and C decreased from 900 to 500 W with increasing argon pressure.
引用
收藏
页码:743 / 751
页数:9
相关论文
共 27 条
[1]  
ACTON JR, 1963, COLD CATHODE DISCHAR, P204
[2]  
CARLSTON EE, 1965, PHYSICAL REVIEW A, V139, P729
[3]   EQUIVALENT DC SPUTTERING YIELDS OF INSULATORS [J].
DAVIDSE, PD ;
MAISSEL, LI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1967, 4 (01) :33-&
[4]   ION ENERGIES AT CATHODE OF A GLOW DISCHARGE [J].
DAVIS, WD ;
VANDERSLICE, TA .
PHYSICAL REVIEW, 1963, 131 (01) :219-&
[5]  
DIETZ LA, 1970, D8RPT7 REP
[6]   CATHODE SPUTTERING IN GLOW DISCHARGES [J].
ECKER, G ;
EMELEUS, KG .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (415) :546-552
[7]  
FRASER DB, 1978, THIN FILM PROCESSES, pCH3
[8]  
HOFFMAN V, 1976, SOLID STATE TECHNOL, V19, P57
[9]  
HUGHES JL, 1978, J VAC SCI TECHNOL, V15, P1576
[10]   SPUTTERING PROCESS MODEL OF DEPOSITION RATE [J].
KELLER, JH ;
SIMMONS, RG .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1979, 23 (01) :24-32