DETERMINATION OF THE RARE-EARTH ELEMENTS IN 13 GSJ SILICATE ROCK REFERENCE SAMPLES BY SECONDARY ION MASS-SPECTROMETRY

被引：7
作者：
MACRAE, ND
WU, TW
机构：
[1] Department of Geology, University of Western Ontario, London, Ontario
来源：
GEOSTANDARDS NEWSLETTER | 1990年 / 14卷 / 01期
关键词：
D O I：
10.1111/j.1751-908X.1990.tb00066.x
中图分类号：
P [天文学、地球科学];
学科分类号：
07 ;
摘要：
Rare earth elements were determined by secondary ion mass spectrometry (SIMS) for 12 igneous rocks and one feldspar separate from the new rock reference samples of the Geological Survey of Japan. The study presents an expanded application of the SIMS facility. Copyright © 1990, Wiley Blackwell. All rights reserved
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页码：119 / 125
页数：7
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