MEASUREMNET OF STRESS AND STRAIN ON SPECIMENS IN AN ELECTRON MICROSCOPE

被引：15

作者：

SAKA, H

IMURA, T

YUKAWA, N

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1971年 / 10卷 / 01期

关键词：

D O I：

10.1143/JJAP.10.1

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1 / &

共 10 条

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[2]

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[5] DIRECT MEASUREMENTS OF MOBILITIES OF EDGE AND SCREW DISLOCATIONS IN FE-3 PERCENT SI ALLOY BY HIGH VOLTAGE ELECTRON TRANSMISSION MICROSCOPY [J].

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[6] A DIRECT METHOD TO INVESTIGATE DYNAMICAL PROPERTIES OF DISLOCATIONS BASED ON HIGH VOLTAGE ELECTRON MICROSCOPY [J].

IMURA, T ;

SAKA, H ;

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JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (03) :405-&

[7]

IMURA T, 1969, BUSSEI, V10, P567

[8] ON PREPARATION OF TENSILE TEST PIECES FOR TRANSMISSION ELECTRON MICROSCOPIC OBSERVATION [J].

SAKA, H ;

IMURA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (03) :406-&

[9] STRESS MEASURABLE TENSILE DEVICE FOR ELECTRON MICROSCOPIC OBSERVATION [J].

SAKA, H ;

IMURA, T ;

YUKAWA, N ;

IGARASHI, I .

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[10]

TAKAHASHI N, 1960, J ELECTRON MICROSC, V9, P104

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