METHODOLOGY FOR SIMULATING A HIGH-RESOLUTION CRT OPTICAL-SYSTEM

A sensitivity analysis requiring a backup OTF-photorecording analysis for evaluating a high resolution CRT optical exposure system is discussed. The analytic tools of the OTF (Optical Transfer Function) analysis such as two dimensional Fourier analysis are considered relative to their application in the computerization of the simulation algorithm. Characteristics of system components, i. e. , the CRT photorecording performance parameters, are analyzed with respect to their utility in the sensitivity function. Practical aspects of the triple analysis are also explored.