PHOTOELECTRON EMISSION MICROSCOPY IN EXAMINATION OF BIOLOGICAL STRUCTURES

被引:0
|
作者
GRUND, S [1 ]
ENGEL, W [1 ]
EICHBERG, J [1 ]
机构
[1] FREE UNIV BERLIN,FACHBEREICH VET MED,FACHRICHTUNG ELEKTR MIKROSKOPIE,D-1000 BERLIN 33,FED REP GER
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:141 / 141
页数:1
相关论文
共 50 条
  • [31] PHOTOELECTRON MICROSCOPY - NEW APPROACH TO MAPPING ORGANIC AND BIOLOGICAL SURFACES
    GRIFFITH, OH
    BIRRELL, GB
    BURKE, CA
    REMPFER, GF
    LEE, GB
    LESCH, GH
    SCHLOSSE.W
    STAFFORD, RG
    MARRIOTT, TB
    MALLON, MH
    JOST, PC
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1972, 69 (03) : 561 - &
  • [32] A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments
    Tromp, R. M.
    Fujikawa, Y.
    Hannon, J. B.
    Ellis, A. W.
    Berghaus, A.
    Schaff, O.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2009, 21 (31)
  • [33] Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)
    Hou, Kun
    Kordesch, Martin E.
    Arp, Uwe
    Zhu, Mingyao
    Outlaw, Ronald A.
    Miraldo, Peter
    Holloway, Brian C.
    Manos, Dennis
    2007 IEEE 20TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, 2007, : 115 - +
  • [34] Hydrogen termination and electron emission from CVD diamond surfaces: a combined secondary electron emission, photoelectron emission microscopy, photoelectron yield, and field emission study
    Cui, JB
    Ristein, J
    Stammler, M
    Janischowsky, K
    Kleber, G
    Ley, L
    DIAMOND AND RELATED MATERIALS, 2000, 9 (3-6) : 1143 - 1147
  • [35] Biological Field Emission Scanning Electron Microscopy
    Qvortrup, Klaus
    MICROSCOPY AND MICROANALYSIS, 2020, 26 (02) : 363 - 363
  • [36] Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited)
    Scholl, A
    Nolting, F
    Stöhr, J
    Regan, T
    Lüning, J
    Seo, JW
    Locquet, JP
    Fompeyrine, J
    Anders, S
    Ohldag, H
    Padmore, HA
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (11) : 7266 - 7268
  • [37] Quantifying field-induced contrast effects in photoelectron emission microscopy
    Siegrist, K
    Ballarotto, VW
    Williams, ED
    ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES, 2004, 803 : 9 - 14
  • [38] Imaging of magnetic data bits and ferromagnetic domains with photoelectron emission microscopy
    Mundschau, M
    Romanowicz, J
    Wang, JY
    Sun, DL
    Chen, HC
    SURFACE REVIEW AND LETTERS, 1998, 5 (06) : 1269 - 1274
  • [39] Free-electron laser photoelectron emission microscopy of human pigments
    Simon, JD
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 230 : U2779 - U2779
  • [40] Photon energy dependence of contrast in photoelectron emission microscopy of Si devices
    Ballarotto, VW
    Siegrist, K
    Phaneuf, RJ
    Williams, ED
    Yang, WC
    Nemanich, RJ
    APPLIED PHYSICS LETTERS, 2001, 78 (22) : 3547 - 3549