Estimating Error in Measuring Thermal Conductivity Using a T-type

被引：5
作者：
Ito, Yohei [1 ]
Takahashi, Koji [1 ]
Fujii, Motoo [2 ]
Zhang, Xing [3 ]
机构：
[1] Kyushu Univ, Dept Aeronaut & Astronaut, Fukuoka, Japan
[2] Natl Inst Adv Ind Sci & Technol, Tokyo, Japan
[3] Tsinghua Univ, Dept Engn Mech, Beijing, Peoples R China
来源：
HEAT TRANSFER-ASIAN RESEARCH | 2009年 / 38卷 / 05期
关键词：
nanowire; thermal conductivity; measurement error; nanosensor;
D O I：
10.1002/htj.20228
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
We discuss the measurement error caused by fabrication and measurement of a T-type nanosensor with a suspended sub-micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one-dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error. (C) 2009 Wiley Periodicals, Inc.
引用
收藏
页码：297 / 312
页数：16
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