Simple electron microscopes

被引：5
|
作者：
Johnson, RP [1 ]
机构：
[1] Gen Elect Co, Schenectady, NY USA
来源：
JOURNAL OF APPLIED PHYSICS | 1938年 / 9卷 / 08期
关键词：
D O I：
10.1063/1.1710448
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：508 / 516
页数：9
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