STRUCTURE DETERMINATION BY X-RAY ABSORPTION

被引：120

作者：

STERN, EA

机构：

来源：

CONTEMPORARY PHYSICS | 1978年 / 19卷 / 04期

关键词：

D O I：

10.1080/00107517808210887

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：289 / 310

页数：22

共 15 条

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PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1977, 74 (05) :1794-1797

[3] STRUCTURAL DETERMINATIONS OF LIQUID SEMICONDUCTORS USING EXTENDED X-RAY ABSORPTION FINE-STRUCTURE [J].

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LYTLE, FW ;

SAYERS, DE ;

STERN, EA .

CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1977, 55 (11) :1968-1974

[4]

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[5]

INGALLS R, 1978, PHYS REV LETT, V40, P333

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LEE, PA ;

BENI, G .

PHYSICAL REVIEW B, 1977, 15 (06) :2862-2883

[7] NEW APPLICATION OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) AS A SURFACE PROBE-NATURE OF OXYGEN INTERACTION WITH A RUTHENIUM CATALYST [J].

LYTLE, FW ;

VIA, GH ;

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JOURNAL OF CHEMICAL PHYSICS, 1977, 67 (08) :3831-3832

[8]

LYTLE FW, 1975, PHYS REV B, V11, P4836

[9] NEW METHOD TO MEASURE STRUCTURAL DISORDER - APPLICATION TO GEO2 GLASS [J].

SAYERS, DE ;

STERN, EA ;

LYTLE, FW .

PHYSICAL REVIEW LETTERS, 1975, 35 (09) :584-587

[10] NEW TECHNIQUE FOR INVESTIGATING NONCRYSTALLINE STRUCTURES - FOURIER ANALYSIS OF EXTENDED X-RAY - ABSORPTION FINE STRUCTURE [J].

SAYERS, DE ;

STERN, EA ;

LYTLE, FW .

PHYSICAL REVIEW LETTERS, 1971, 27 (18) :1204-&

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