CMOS INTEGRATED-CIRCUIT RELIABILITY

被引：5
作者：
SCHNABLE, GL
COMIZZOLI, RB
机构：
来源：
MICROELECTRONICS RELIABILITY | 1981年 / 21卷 / 01期
关键词：
D O I：
10.1016/0026-2714(81)90544-8
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：33 / 50
页数：18
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