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LARGE SIGNAL ANALYSIS OF ABRUPT JUNCTION SILICON IMPATT DIODES
被引:1
作者
:
THOMSON, I
论文数:
0
引用数:
0
h-index:
0
THOMSON, I
机构
:
来源
:
INTERNATIONAL JOURNAL OF ELECTRONICS
|
1972年
/ 32卷
/ 02期
关键词
:
D O I
:
10.1080/00207217208938277
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:121 / &
相关论文
共 14 条
[11]
SCHARFETTER DL, 1969, IEEE T ELECTRON DEVI, VED16, P64
[12]
IMPATT OSCILLATOR PERFORMANCE IMPROVEMENT WITH SECOND-HARMONIC TUNING
SWAN, CB
论文数:
0
引用数:
0
h-index:
0
SWAN, CB
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1968,
56
(09):
: 1616
-
&
[13]
AVALANCHE BREAKDOWN VOLTAGES OF ABRUPT AND LINEARLY GRADED P-N JUNCTIONS IN GE SI GAAS AND GAP - (DOPANT EFFECTS IMPURITY EFFECTS T)
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
GIBBONS, G
论文数:
0
引用数:
0
h-index:
0
GIBBONS, G
[J].
APPLIED PHYSICS LETTERS,
1966,
8
(05)
: 111
-
&
[14]
HIGH-EFFICIENCY CONTINUOUS OSCILLATIONS IN SILICON IMPATT DIODES BELOW TRANSIT-TIME FREQUENCY
THOMSON, I
论文数:
0
引用数:
0
h-index:
0
机构:
Nelson Research Laboratories English Electric Co. Beaconhill, Staffs.
THOMSON, I
[J].
ELECTRONICS LETTERS,
1969,
5
(11)
: 229
-
&
←
1
2
→
共 14 条
[11]
SCHARFETTER DL, 1969, IEEE T ELECTRON DEVI, VED16, P64
[12]
IMPATT OSCILLATOR PERFORMANCE IMPROVEMENT WITH SECOND-HARMONIC TUNING
SWAN, CB
论文数:
0
引用数:
0
h-index:
0
SWAN, CB
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1968,
56
(09):
: 1616
-
&
[13]
AVALANCHE BREAKDOWN VOLTAGES OF ABRUPT AND LINEARLY GRADED P-N JUNCTIONS IN GE SI GAAS AND GAP - (DOPANT EFFECTS IMPURITY EFFECTS T)
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
GIBBONS, G
论文数:
0
引用数:
0
h-index:
0
GIBBONS, G
[J].
APPLIED PHYSICS LETTERS,
1966,
8
(05)
: 111
-
&
[14]
HIGH-EFFICIENCY CONTINUOUS OSCILLATIONS IN SILICON IMPATT DIODES BELOW TRANSIT-TIME FREQUENCY
THOMSON, I
论文数:
0
引用数:
0
h-index:
0
机构:
Nelson Research Laboratories English Electric Co. Beaconhill, Staffs.
THOMSON, I
[J].
ELECTRONICS LETTERS,
1969,
5
(11)
: 229
-
&
←
1
2
→