INSTITUTE OF PHYSICS CONFERENCE SERIES
|
1991年
/
117期
关键词:
MISFIT DISLOCATIONS;
D O I:
暂无
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
Dipole formation at the interfaces of InGaAs/GaAs multilayers has been studied. Slip dipoles with sides along <110> are demonstrated and their use to reduce residual threading dislocation density for strained layer materials is shown. A detailed diffraction contrast analysis has been performed upon dipoles that have <010> line directions. These dipoles also relieve misfit and probably arise from a climb process.