NEW MODEL FOR DAMAGE ACCUMULATION IN SI DURING SELF-ION IRRADIATION

被引:84
作者
HOLLAND, OW [1 ]
PENNYCOOK, SJ [1 ]
机构
[1] N TEXAS STATE UNIV,DENTON,TX 76203
关键词
D O I
10.1063/1.102011
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:2503 / 2505
页数:3
相关论文
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