ADAPTATION OF MULTILAYER FORMALISM TO THE SOLUTION OF TEMPERATURE-DEPENDENT X-RAY-DIFFRACTION IN CRYSTALS

被引:2
作者
GOLDSTEIN, WH [1 ]
HAILEY, CJ [1 ]
LUPTON, JH [1 ]
机构
[1] KMS FUS INC,ANN ARBOR,MI 48106
关键词
MULTILAYER CRYSTAL MODELLING - STRAINED/HEATED CRYSTALS - X-RAY REFLECTIVITY;
D O I
10.1016/0030-4018(87)90169-6
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:259 / 264
页数:6
相关论文
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