EFFECTS IN AUGER-ELECTRON SPECTROSCOPY DUE TO PROBING ELECTRONS AND SPUTTERING

被引：19

作者：

BRAUN, P ^{[1
]}

FARBER, W ^{[1
]}

BETZ, G ^{[1
]}

VIEHBOCK, FP ^{[1
]}

机构：

[1] UNIV TECHNOL VIENNA,INST ALLGEMEINE PHYS,VIENNA A-1040,AUSTRIA

来源：

VACUUM | 1977年 / 27卷 / 03期

关键词：

D O I：

10.1016/0042-207X(77)90039-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：103 / 108

页数：6

共 22 条

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[2]

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[4]

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[6] SPUTTERING OF ALLOY SYSTEMS AG-AU, AU-CU AND AG-CU STUDIED BY AUGER-ELECTRON SPECTROSCOPY [J].

FARBER, W ;

BETZ, G ;

BRAUN, P .

NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F) :351-354

[7] OXYGEN EXPOSURE OF SM, GD AND TB STUDIED BY AUGER-ELECTRON SPECTROSCOPY [J].

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BRAUN, P .

SURFACE SCIENCE, 1974, 41 (01) :195-204

[8]

FARBER W, 1975, THESIS VIENNA

[9]

Gallon T. E., 1972, Review of Physics in Technology, V3, P31, DOI 10.1088/0034-6683/3/1/I02

[10]

Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700

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