RESOLUTION LIMITS OF MICROSCOPY THROUGH SCATTERING LAYERS

被引：12

作者：

KEMPE, M

THON, A

RUDOLPH, W

机构：

[1] The University of New Mexico, Department of Physics and Astronomy, Albuquerque

来源：

OPTICS COMMUNICATIONS | 1994年 / 110卷 / 5-6期

关键词：

D O I：

10.1016/0030-4018(94)90237-2

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The combination of confocal microscopy and suitable correlation methods with short light pulses is shown to enable imaging with micrometer resolution through scattering media with potential applications in biology and medicine. Experimental and theoretical investigations are presented describing fundamental limits of this imaging technique.

引用

页码：492 / 496

页数：5

共 18 条

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