DIRECT EXAMINATION OF CERAMIC SURFACES WITH THE SCANNING ELECTRON MICROSCOPE

被引：15

作者：

THORNLEY, RFM

CARTZ, L

机构：

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1962年 / 45卷 / 09期

关键词：

D O I：

10.1111/j.1151-2916.1962.tb11187.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：425 / 428

页数：4

共 15 条

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[6]

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[7] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J].

MCMULLAN, D ;

THEWLIS, J ;

AGAR, AW ;

GABOR, D ;

HAINE, ME ;

LUBSZYNSKI, HG ;

FEINBERG, R ;

MCMULLAN, D .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75) :245-259

[8]

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[9]

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[10]

Oatley C.W., 1957, J ELECTRON CONTR, V2, P568

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