ELECTRON-OPTICAL CHARACTERISTICS OF A FIELD-EMISSION GUN

被引：0
|
作者：
KERN, D
KURZ, D
SPEIDEL, R
机构：
来源：
OPTIK | 1978年 / 52卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：61 / 70
页数：10
相关论文
共 50 条
  • [1] ANALYSIS OF ELECTRON-OPTICAL PROPERTIES OF THE DIODE REGION OF A FIELD-EMISSION GUN
    SUZUKI, M
    SHIMOYAMA, H
    MARUSE, S
    JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (03): : 322 - 322
  • [2] OPTICAL CHARACTERISTICS OF THE ELECTRON SOURCE GIVEN BY A TETRODE FIELD-EMISSION GUN
    ROQUES, S
    DENIZART, M
    SONIER, F
    OPTIK, 1983, 64 (04): : 299 - 312
  • [3] ELECTRON-OPTICAL PROPERTIES OF NANOMETER FIELD-EMISSION ELECTRON SOURCES
    QIAN, W
    SCHEINFEIN, MR
    SPENCE, JCH
    APPLIED PHYSICS LETTERS, 1993, 62 (03) : 315 - 317
  • [4] ELECTRON-OPTICAL PROPERTIES AND ABERRATIONS OF FIELD-EMISSION MICROSOURCES
    XIMEN, JY
    XIMEN, HY
    ZHOU, L
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (02): : 275 - 280
  • [5] Wave-Mechanical Electron-Optical Modeling of Field-Emission Electron Sources
    Krecinic, Faruk
    Ernstorfer, Ralph
    PHYSICAL REVIEW APPLIED, 2021, 15 (06):
  • [6] LENS CHARACTERISTICS OF FIELD-EMISSION GUN
    OHYE, T
    UCHIKAWA, Y
    MORITA, C
    SHIMOYAMA, H
    JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 294 - 294
  • [7] ELECTRON-OPTICAL DESIGN OF A HIGH-RESOLUTION LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE WITH FIELD-EMISSION GUN
    XIMEN, JY
    LIN, PSD
    PAWLEY, JB
    SCHIPPERT, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (10) : 2905 - 2910
  • [8] Field-emission electron gun for a MEMS electron microscope
    Krysztof, Michal
    MICROSYSTEMS & NANOENGINEERING, 2021, 7 (01)
  • [9] FIELD-EMISSION GUN FOR A LINEAR ELECTRON ACCELERATOR
    BOGDANOV.BY
    DANILICH.VA
    VORONKOV, RM
    GASS, VF
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (01): : 42 - &
  • [10] ELECTRON-GUN WITH FIELD-EMISSION CATHODE
    SPEIDEL, R
    VORSTER, F
    OPTIK, 1975, 42 (05): : 383 - 390
12345