SPATIALLY-RESOLVED TUNNELING SPECTROSCOPY ON BI2SR2CACU2OX
被引:2
作者:
BOON, EJG
论文数: 0引用数: 0
h-index: 0
机构:University of Nijmegen, 6525 ED Nijmegen, Toernooiveld
BOON, EJG
VANROY, AJA
论文数: 0引用数: 0
h-index: 0
机构:University of Nijmegen, 6525 ED Nijmegen, Toernooiveld
VANROY, AJA
VANKEMPEN, H
论文数: 0引用数: 0
h-index: 0
机构:University of Nijmegen, 6525 ED Nijmegen, Toernooiveld
VANKEMPEN, H
机构:
[1] University of Nijmegen, 6525 ED Nijmegen, Toernooiveld
来源:
PHYSICA C
|
1994年
/
235卷
关键词:
D O I:
10.1016/0921-4534(94)92161-X
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We present STM measurements on in-situ cleaved Bi2Sr2CaCu2Ox crystals at 4.2K. By cleaving at low temperature we obtained a clean surface allowing us to image with atomic resolution. We observed a transition from clear superconductor - normal metal tunneling characteristics to charging-like characteristics within a few nanometers.