THE ATOMIC FORCE MICROSCOPE - A TOOL FOR SCIENCE AND INDUSTRY

被引：57
作者：
GOULD, SAC
DRAKE, B
PRATER, CB
WEISENHORN, AL
MANNE, S
KELDERMAN, GL
BUTT, HJ
HANSMA, H
HANSMA, PK
MAGONOV, S
CANTOW, HJ
机构：
[1] ACAD SCI USSR,INST CHEM PHYS,MOSCOW 117977,USSR
[2] UNIV FREIBURG,INST MACROMOLEC CHEM,W-7800 FREIBURG,GERMANY
来源：
ULTRAMICROSCOPY | 1990年 / 33卷 / 02期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/0304-3991(90)90011-A
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples. © 1990.
引用
收藏
页码：93 / 98
页数：6
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