FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS

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|

作者：

HUTTEN, A ^{[1
]}

HAASEN, P ^{[1
]}

机构：

[1] SONDERFORSCH BEREICH 126,D-3400 GOTTINGEN,FED REP GER

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 08期

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中图分类号：

O59 [应用物理学];

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页码：3769 / 3771

页数：3

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