LASER-BEAM TESTING OF FINISHED INTEGRATED-CIRCUITS

被引：0
作者：
AUVERT, G
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1987年 / 87期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：563 / 572
页数：10
相关论文
共 50 条
[41]   ELECTRON-BEAM MICROFABRICATION OF GAAS INTEGRATED-CIRCUITS [J].
OZDEMIR, FS ;
HACKETT, LH ;
GREILING, PT ;
KRUMM, CF ;
OTTO, OW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) :C158-C158
[42]   THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS [J].
WATERS, DGP .
BRITISH TELECOMMUNICATIONS ENGINEERING, 1982, 1 (JUL) :64-69
[43]   LICAT SYSTEM FOR AUTOMATIC TESTING OF LINEAR INTEGRATED-CIRCUITS [J].
TASSINARI, V ;
CEREDA, V .
ALTA FREQUENZA, 1981, 50 (05) :279-283
[44]   SOME INVESTIGATIONS INTO OPTICAL PROBE TESTING OF INTEGRATED-CIRCUITS [J].
EDWARDS, WD ;
SMITH, JG ;
KEMHADJIAN, HA .
RADIO AND ELECTRONIC ENGINEER, 1976, 46 (01) :35-41
[45]   1983 ELECTRONIC MEETINGS - TESTING COMPLEX INTEGRATED-CIRCUITS [J].
不详 .
MICROPROCESSING AND MICROPROGRAMMING, 1984, 13 (03) :206-210
[46]   ELECTRON DETECTORS FOR ELECTRON-BEAM TESTING OF ULTRA LARGE-SCALE INTEGRATED-CIRCUITS [J].
GARTH, SCJ ;
SPICER, DF .
SCANNING ELECTRON MICROSCOPY, 1986, 1986 :465-472
[47]   LASER CUTTING OF ALUMINUM STRIPES FOR DEBUGGING INTEGRATED-CIRCUITS [J].
YAMAGUCHI, H ;
HONGO, M ;
MIYAUCHI, T ;
MITANI, M .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (06) :1259-1264
[48]   BINARY STATES IN INTEGRATED-CIRCUITS INVESTIGATED BY LASER SCANNING MICROSCOPY WITH OPTICAL BEAM INDUCED CURRENT [J].
BERGNER, H ;
DAMM, T .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 115 (02) :607-615
[49]   PULSED LASER-INDUCED SEU IN INTEGRATED-CIRCUITS - A PRACTICAL METHOD FOR HARDNESS ASSURANCE TESTING [J].
BUCHNER, S ;
KANG, K ;
STAPOR, WJ ;
CAMPBELL, AB ;
KNUDSON, AR ;
MCDONALD, P ;
RIVET, S .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1825-1831
[50]   LINEAR INTEGRATED-CIRCUITS [J].
HUFFMAN, G .
EDN MAGAZINE-ELECTRICAL DESIGN NEWS, 1980, 25 (04) :96-103
12345