THE CRYSTALLOGRAPHY OF CA1-XFX USING X-RAY-POWDER DIFFRACTION TECHNIQUES

被引:6
作者
GUIRADO, F [1 ]
GALI, S [1 ]
CHINCHON, JS [1 ]
机构
[1] UNIV BARCELONA,DEPT CRISTALLOGRAFIA,E-08028 BARCELONA,SPAIN
关键词
D O I
10.1016/0008-8846(94)90012-4
中图分类号
TU [建筑科学];
学科分类号
0813 ;
摘要
The system CA-CF shows two solid solutions series: C(A,F) and C(F,A).We have analysed the variation of the cell parameters of the solid solution CA1-xFx (x indicating molar fraction of CF) depending on the initial weight percent of CF, using X-ray diffraction (XRD) and two different methods of cell parameter refinement: Peak Maxima-Matching Method and Rietveld Profile-Fitting Method. The solid solution end is placed at 16'5 wt% of CF (x=0.125). This value has been calculated through the aluminium population factor in the CA phase structure, as well.
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页码:923 / 930
页数:8
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