ELECTRON-ATTACHMENT TO C60 AT LOW ENERGIES

被引：74
|
作者：
SMITH, D
SPANEL, P
MARK, TD
机构：
[1] Institut für Ionenphysik, Universität Innsbruck, A-6020 Innsbruck
来源：
CHEMICAL PHYSICS LETTERS | 1993年 / 213卷 / 1-2期
关键词：
D O I：
10.1016/0009-2614(93)85441-P
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Measurements are described of the rate coefficients, beta, for electron attachment to C60 molecules within the electron temperature range 500-4500 K obtained using our flowing afterglow/ Langmuir probe (FALP) apparatus. At a T(e) of 500 K, the beta is small but it increases rapidly with T(e) reaching a value of 3 x 10(-7) cm3 s-1 at 4500 K. Thus an activation energy barrier of 0.26 eV is indicated for electron attachment to C60. The beta at a T(e) of 4500 K is greater than is expected on the basis of s-wave capture theory which we attribute to the large size of the C60 molecule.
引用
收藏
页码：202 / 206
页数：5
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