ELECTROREFLECTANCE MEASUREMENTS ON CDXHG1-XTE

被引:7
作者
MORITANI, A
TANIGUCHI, K
HAMAGUCHI, C
NAKAI, J
UEDA, R
OHTSUKI, O
UEDA, Y
机构
关键词
D O I
10.1143/JPSJ.31.945
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:945 / +
页数:1
相关论文
共 5 条
[1]   ELECTROREFLECTANCE AT A SEMICONDUCTOR-ELECTROLYTE INTERFACE [J].
CARDONA, M ;
SHAKLEE, KL ;
POLLAK, FH .
PHYSICAL REVIEW, 1967, 154 (03) :696-+
[2]   FUNDAMENTAL REFLECTIVITY SPECTRUM OF CDXHG1-XTE CRYSTALS FROM 1.5-EV TO 4-EV [J].
GALAZKA, RR ;
KISIEL, A .
PHYSICA STATUS SOLIDI, 1969, 34 (01) :63-&
[3]  
LONG D, 1970, SEMICONDUCT SEMIMET, V5, P175
[4]   OPTICAL PROPERTIES OF EPITAXIAL FILMS OF CDCHIHG1-CHITE [J].
LUDEKE, R ;
PAUL, W .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) :3499-&
[5]  
VERIE C, 1967, P INT 2 6 COMPOUNDS, P1124