DETERMINATION OF STATIC BOND CHARGE PROPERTIES IN GA1-XINXAS AND GAAS1-YPY SOLID-SOLUTIONS

[1] BILDERBACK DH, THESIS

[2] Bruhl H.-G., 1975, Kristall und Technik, V10, P979, DOI 10.1002/crat.19750100909

[3] BRUHL HG, UNPUBLISHED

[4] BRUHL HG, 1976, KRISTALL TECHNIK, V10, pK57

[5] RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS [J]. JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) : 1891 - &

[6] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 187 - 194

[7] STUDIUM VON EINZELVERSETZUNGEN IN NAHEZU IDEALEN KRISTALLEN MIT EINER RONTGENMETHODE [J]. ZEITSCHRIFT FUR PHYSIK, 1962, 168 (01): : 10 - &

[8] RELATIVE INTEGRATED INTENSITY OF X-RAY DIFFRACTION AND EFFECTIVE CHAARGE IN GAAS1-XPX COMPOUNDS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (07) : 835 - &

[9] IONICITY OF CHEMICAL BOND IN CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1970, 42 (03) : 317 - &

[10] X-RAY BOND CHARGE IN GAAS AND INSB [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 103 (01): : 93 - 100

[1] BILDERBACK DH, THESIS

[2] Bruhl H.-G., 1975, Kristall und Technik, V10, P979, DOI 10.1002/crat.19750100909

[3] BRUHL HG, UNPUBLISHED

[4] BRUHL HG, 1976, KRISTALL TECHNIK, V10, pK57

[5] RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS [J]. JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) : 1891 - &

[6] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 187 - 194

[7] STUDIUM VON EINZELVERSETZUNGEN IN NAHEZU IDEALEN KRISTALLEN MIT EINER RONTGENMETHODE [J]. ZEITSCHRIFT FUR PHYSIK, 1962, 168 (01): : 10 - &

[8] RELATIVE INTEGRATED INTENSITY OF X-RAY DIFFRACTION AND EFFECTIVE CHAARGE IN GAAS1-XPX COMPOUNDS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (07) : 835 - &

[9] IONICITY OF CHEMICAL BOND IN CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1970, 42 (03) : 317 - &

[10] X-RAY BOND CHARGE IN GAAS AND INSB [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 103 (01): : 93 - 100