共 13 条
[2]
ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61
[4]
EVANS CA, 1975, ANAL CHEM, V47, P818
[6]
SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975, 12 (01)
:385-391
[8]
MAYER JW, 1974, ION BEAM SURFACE LAY
[10]
SLODZIAN G, 1966, CR ACAD SCI B PHYS, V263, P1246