MECHANISM OF SIMS MATRIX EFFECT

被引:216
作者
DELINE, VR
KATZ, W
EVANS, CA
机构
[1] UNIV ILLINOIS,DEPT CHEM,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
关键词
D O I
10.1063/1.90546
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:832 / 835
页数:4
相关论文
共 13 条
[1]   ION MICROPROBE MASS ANALYZER [J].
ANDERSEN, CA ;
HINTHORNE, JR .
SCIENCE, 1972, 175 (4024) :853-+
[2]  
ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61
[3]   ADSORPTION OF GASES STUDIED BY SECONDARY ION EMISSION MASS-SPECTROMETRY [J].
BLAISE, G ;
BERNHEIM, M .
SURFACE SCIENCE, 1975, 47 (01) :324-343
[4]  
EVANS CA, 1975, ANAL CHEM, V47, P818
[6]   SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING [J].
LIEBL, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :385-391
[7]   THIN-FILMS AND SOLID-PHASE REACTIONS [J].
MAYER, JW ;
POATE, JM ;
TU, KN .
SCIENCE, 1975, 190 (4211) :228-234
[8]  
MAYER JW, 1974, ION BEAM SURFACE LAY
[9]   SPUTTERING OF PTSI AND NISI [J].
POATE, JM ;
BROWN, WL ;
HOMER, R ;
AUGUSTYNIAK, WM ;
MAYER, JW ;
TU, KN ;
VANDERWEG, WF .
NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F) :345-349
[10]  
SLODZIAN G, 1966, CR ACAD SCI B PHYS, V263, P1246