ELECTRON-BEAM INDUCED CURRENT TECHNIQUE IMAGING APPLIED TO SURFACE-REACTION STUDY

被引：0

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作者：

DAUCHOT, JP

DATH, JP

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来源：

THIN SOLID FILMS | 1989年 / 176卷 / 01期

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D O I：

10.1016/0040-6090(89)90375-1

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T [工业技术];

学科分类号：

08 ;

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页码：L157 / L160

页数：4

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