HRTEM OBSERVATION OF GRAIN-BOUNDARIES AND SURFACES OF TE CRYSTALS

被引：0
|
作者：
ISSHIKI, T [1 ]
HIROTA, Y [1 ]
SHIOJIRI, M [1 ]
机构：
[1] KYOTO INST TECHNOL,DEPT PHYS,SAKYO KU,KYOTO 606,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1987年 / 36卷 / 05期
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：301 / 301
页数：1
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