MINORITY-CARRIER LIFETIME MEASUREMENT IN GAAS

被引：1
|
作者：
PENCE, IW [1 ]
GREILING, PT [1 ]
机构：
[1] UNIV CALIF,SCH ENGN & APPL SCI,ELECT SCI & ENGN DEPT,LOS ANGELES,CA 90024
来源：
PROCEEDINGS OF THE IEEE | 1974年 / 62卷 / 07期
关键词：
D O I：
10.1109/PROC.1974.9557
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1030 / 1031
页数：2
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