HIGH-ENERGY AUGER AND MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION AS A PROBE OF ULTRA-THIN EPITAXIAL OVERLAYERS, SANDWICHES AND SUPERLATTICES

被引：24

作者：

CHAMBERS, SA ^{[1
]}

VITOMIROV, IM ^{[1
]}

ANDERSON, SB ^{[1
]}

CHEN, HW ^{[1
]}

WAGENER, TJ ^{[1
]}

WEAVER, JH ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

SUPERLATTICES AND MICROSTRUCTURES | 1987年 / 3卷 / 05期

关键词：

D O I：

10.1016/0749-6036(87)90242-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：563 / 571

页数：9

共 24 条

[1] FERROMAGNETIC MOMENTS IN METASTABLE MAGNETIC-FILMS BY SPIN-POLARIZED-NEUTRON REFLECTION [J].

BLAND, JAC ;

PESCIA, D ;

WILLIS, RF .

PHYSICAL REVIEW LETTERS, 1987, 58 (12) :1244-1247

[2] DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION [J].

BULLOCK, EL ;

FADLEY, CS .

PHYSICAL REVIEW B, 1985, 31 (02) :1212-1215

[3] MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION AS A PROBE OF ELASTIC STRAIN IN EPITAXIAL OVERLAYERS [J].

CHAMBERS, SA ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 35 (05) :2490-2493

[4] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (08) :4872-4875

[5] GROWTH OF METASTABLE FCC CO ON NI(001) [J].

CHAMBERS, SA ;

ANDERSON, SB ;

CHEN, HW ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 35 (06) :2592-2597

[6] SIMULTANEOUS EPITAXY AND SUBSTRATE OUT-DIFFUSION AT A METAL-SEMICONDUCTOR INTERFACE - FE/GAAS(001)-C(8X2) [J].

CHAMBERS, SA ;

XU, F ;

CHEN, HW ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (10) :6605-6611

[7] DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001) [J].

CHAMBERS, SA ;

CHEN, HW ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 33 (12) :8810-8813

[8] INCIDENT BEAM EFFECTS IN ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY [J].

CHAMBERS, SA ;

CHEN, HW ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (05) :3055-3059

[9]

CHAMBERS SA, IN PRESS PHYSICAL B

[10]

CHAMBERS SA, 1987, PHYSICAL REV B, V36, pR30

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