INCREASE IN PENETRATION OF ELECTRON MICROSCOPE SPECIMENS AT HIGH VOLTAGES

被引：7

作者：

HALE, KF

BROWN, MH

机构：

来源：

关键词：

D O I：

10.1038/2211232a0

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：1232 / &

共 10 条

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FUJITA, H ;

KAWASAKI, Y ;

FURUBAYA.EI ;

KAJIWARA, S ;

TAOKA, T .

[5]

HALE KF, 1966, NAT PHYS LAB REP FV, P10

[6]

HALE KF, 1967, NEW SCIENTIST, V35, P616

[7]

HIRSCH PB, 1968, 4 P EUR REG C EL MIC, V1, P49

[8] An Introduction to High-Voltage Electron Microscopy [J].

Makin, M. J. ;

Sharp, J. V. .

[9]

MAKIN MJ, 1967, R5570 AERE REP

[10] ELECTRON MICROSCOPY AT HIGH VOLTAGES [J].

THOMAS, G .

PHILOSOPHICAL MAGAZINE, 1968, 17 (150) :1097-&