Structural and optical properties of nanocrystalline alpha-MoO3 thin films prepared at different annealing temperatures

被引:50
作者
Hojabri, A. [1 ]
Hajakbari, F. [1 ]
Meibodi, A. Emami [1 ]
机构
[1] Islamic Azad Univ, Karaj Branch, Dept Phys, Karaj, Iran
关键词
MoO3; Thin film; Layered structure; Annealing temperature; Nanocrystalline;
D O I
10.1007/s40094-014-0161-5
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanocrystalline alpha-MoO3 thin films were prepared successfully by thermal annealing of molybdenum (Mo) thin films deposited on quartz and silicon substrates using DC magnetron sputtering method. The influence of annealing temperatures ranging from 400 to 1,000 degrees C on the structural, morphological and optical properties of the prepared films was investigated by X-ray diffraction, Fourier transform infrared spectrophotometer (FTIR) atomic force microscopic and UV-vis spectroscopy, respectively. The results show that the crystallinity and surface morphology of the films are strongly dependent on the annealing temperature. Also, the optimum annealing temperature of Mo films in our experiment was 600 degrees C and the films formed at this temperature exhibit only the (0k0) reflections and indicated the layered structure of alpha-MoO3. The FTIR spectra confirm the formation of MoO3. The transmittance of the MoO3 films on quartz substrate was improved with increasing annealing temperature.
引用
收藏
页码:67 / 73
页数:7
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