SILICON RADIATION DETECTOR ANALYSIS USING BACK ELECTRON-BEAM INDUCED CURRENT

被引：4
|
作者：
GUYE, R [1 ]
JARRON, P [1 ]
机构：
[1] CERN,CH-1211 GENEVA 23,SWITZERLAND
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 253卷 / 03期
关键词：
D O I：
10.1016/0168-9002(87)90513-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：319 / 324
页数：6
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