USE OF HIGH-PRECISION INTERFEROMETRY TO OBTAIN PHYSICAL AND CHEMICAL DATA

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作者：
INGELSTAM, E
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来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1960年 / 50卷 / 11期
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O4 [物理学];
学科分类号：
0702 ;
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页码：1130 / 1130
页数：1
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