WEIBULL STATISTICS IN SHORT-TERM DIELECTRIC-BREAKDOWN OF THIN POLYETHYLENE FILMS

被引：43

作者：

CACCIARI, M ^{[1
]}

MAZZANTI, G ^{[1
]}

MONTANARI, GC ^{[1
]}

机构：

[1] UNIV BOLOGNA,IST ELETTROTECN IND,I-40126 BOLOGNA,ITALY

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 1994年 / 1卷 / 01期

关键词：

D O I：

10.1109/94.300243

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Results of electric strength tests performed on specimens cut from aged and unaged EPR-insulated HV cables are processed by the two and three parameter Weibull function. It is shown that the latter often fits the experimental data better than the former, but the difference is not significant, except, in a few cases, for the lowest percentiles. Therefore, the easier distribution parameter estimation and smaller confidence intervals of parameters and percentiles generally support the use of the two-parameter Weibull function.

引用

页码：153 / 159

页数：7

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