MEASUREMENT OF MINORITY CARRIER LIFETIMES WITH THE SURFACE PHOTOVOLTAGE

被引：81

作者：

JOHNSON, EO

机构：

来源：

关键词：

D O I：

10.1063/1.1722650

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1349 / 1353

页数：5

共 8 条

[1]

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[4]

JOHNSON EL, UNPUBLISHED

[5] REVIEW OF GERMANIUM SURFACE PHENOMENA [J].

KINGSTON, RH .

[6]

NELSON H, 1956, RCA REV, V17, P5

[7] MEASUREMENT OF CARRIER LIFETIMES IN GERMANIUM AND SILICON [J].

STEVENSON, DT ;

KEYES, RJ .

[8] MEASUREMENT OF MINORITY CARRIER LIFETIME IN GERMANIUM [J].

VALDES, LB .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (11) :1420-1423