THERMAL-CONDUCTIVITY MEASUREMENT FROM 30-K TO 750-K - THE 3-OMEGA METHOD

被引:1603
作者
CAHILL, DG [1 ]
机构
[1] CORNELL UNIV,ATOM & SOLID STATE PHYS LAB,ITHACA,NY 14853
关键词
D O I
10.1063/1.1141498
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.
引用
收藏
页码:802 / 808
页数:7
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