THERMAL-CONDUCTIVITY MEASUREMENT FROM 30-K TO 750-K - THE 3-OMEGA METHOD

被引：1607

作者：

CAHILL, DG ^{[1
]}

机构：

[1] CORNELL UNIV,ATOM & SOLID STATE PHYS LAB,ITHACA,NY 14853

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 02期

关键词：

D O I：

10.1063/1.1141498

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

引用

页码：802 / 808

页数：7

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