OPTICALLY STABILIZED, CONSTANT-HEIGHT MODE-OPERATION OF A MAGNETIC FORCE MICROSCOPE

被引:7
作者
PROKSCH, R
DAHLBERG, ED
机构
[1] School of Physics and Astronomy, University of Minnesota, Minneapolis
关键词
D O I
10.1063/1.353533
中图分类号
O59 [应用物理学];
学科分类号
摘要
An optical technique for constant-height mode scanning force microscopy has been developed. This approach allows the sample-tip spacing to be held constant or varied in a quantitative manner during data acquisition. The technique uses an all-fiber interferometric system extended to include two optical cavities: one between the fiber and the cantilever and a second between the fiber and the sample surface. It is necessary that the cantilever be semitransparent or that the fiber be positioned over the edge of the cantilever. It has been experimentally verified that either case allows sufficient laser light for both the cantilever-fiber and the sample-fiber cavities. This method can be used to monitor the time dependence of surface forces, magnetic or electric phase transitions, or as a height calibration for use with scanning force microscopy. As a demonstration of the technique, spatially localized observations of the ferromagnetic phase transition in a gadolinium film are presented. During this observed phase transition, the tip-sample separation was held constant at 1000 nm with a drift of only 3 nm, nominal, for 15 min while the temperature was cycled between 285 and 295 K.
引用
收藏
页码:5808 / 5810
页数:3
相关论文
共 4 条
  • [1] MAGNETIC FORCE MICROSCOPY OF THIN PERMALLOY-FILMS
    MAMIN, HJ
    RUGAR, D
    STERN, JE
    FONTANA, RE
    KASIRAJ, P
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (03) : 318 - 320
  • [2] IMPROVED FIBER-OPTIC INTERFEROMETER FOR ATOMIC FORCE MICROSCOPY
    RUGAR, D
    MAMIN, HJ
    GUETHNER, P
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (25) : 2588 - 2590
  • [3] SARID D, 1991, SCANNING FORCE MICRO, P75
  • [4] SEPARATION OF MAGNETIC AND TOPOGRAPHIC EFFECTS IN FORCE MICROSCOPY
    SCHONENBERGER, C
    ALVARADO, SF
    LAMBERT, SE
    SANDERS, IL
    [J]. JOURNAL OF APPLIED PHYSICS, 1990, 67 (12) : 7278 - 7280