RADIATION EFFECTS IN ION-IMPLANTED SOS CAPACITORS WITH NEGATIVE CHARGE

被引：1

作者：

REPACE, JL

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1978年 / 25卷 / 06期

关键词：

D O I：

10.1109/TNS.1978.4329551

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1450 / 1453

页数：4

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