MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE

被引：512
作者：
BURNHAM, NA
COLTON, RJ
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期
关键词：
D O I：
10.1116/1.576168
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
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页码：2906 / 2913
页数：8
相关论文
共 32 条
[1]   ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602
[2]   IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
DOVEK, MM ;
LANG, CA ;
GRUTTER, P ;
QUATE, CF ;
KUAN, SWJ ;
FRANK, CW ;
PEASE, RFW .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1178-1184
[3]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[6]  
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[7]  
BLAU PJ, 1985, MICROINDENTATION TEC
[8]   A method for interpreting the data from depth-sensing indentation instruments [J].
Doerner, M. F. ;
Nix, W. D. .
JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) :601-609
[9]   EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J].
DURIG, U ;
GIMZEWSKI, JK ;
POHL, DW .
PHYSICAL REVIEW LETTERS, 1986, 57 (19) :2403-2406
[10]   ATOMIC SCALE FRICTION BETWEEN THE MUSCOVITE MICA CLEAVAGE PLANE AND A TUNGSTEN TIP [J].
ERLANDSSON, R ;
HADZIIOANNOU, G ;
MATE, CM ;
MCCLELLAND, GM ;
CHIANG, S .
JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (08) :5190-5193
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