REAL-TIME SAMPLING ELECTRONICS FOR DOUBLE MODULATION EXPERIMENTS WITH FOURIER-TRANSFORM INFRARED SPECTROMETERS

被引：125

作者：

GREEN, MJ ^{[1
]}

BARNER, BJ ^{[1
]}

CORN, RM ^{[1
]}

机构：

[1] UNIV WISCONSIN,DEPT CHEM,1101 UNIV AVE,MADISON,WI 53706

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 06期

关键词：

D O I：

10.1063/1.1142462

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A novel synchronous real-time analog sampling method for obtaining the sum and difference interferograms in double modulation Fourier transform infrared absorption experiments is described, and the application of this sampling methodology to polarization-modulation FTIR measurements of thin films at metal surfaces is demonstrated. A quadratic approximation of the background signal is used to calculate the difference interferogram. The demodulation of a test waveform with the real-time sampling electronics reveals how the bandwidth limitations of previous double modulation experiments on FTIR interferometers that employed lock-in amplifiers have been eliminated.

引用

页码：1426 / 1430

页数：5

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