COMPARISON OF MOIRE AND RANDOM PATTERN CORRELATION TECHNIQUES FOR STRAIN MEASUREMENT

被引：0

作者：

SAWATARI, T ^{[1
]}

机构：

[1] BENDIX RES LABS,SOUTHFIELD,MI 48076

来源：

OPTICS COMMUNICATIONS | 1974年 / 10卷 / 01期

关键词：

D O I：

10.1016/0030-4018(74)90111-4

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：85 / 87

页数：3

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