PREPARATION AND USES OF SILICA REPLICAS IN ELECTRON MICROSCOPY

被引：15

作者：

GEROULD, CH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1947年 / 18卷 / 04期

关键词：

D O I：

10.1063/1.1697655

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：333 / 343

页数：11

共 12 条

[1] ELECTRON MICROSCOPICAL REPLICA TECHNIQUES FOR THE STUDY OF ORGANIC SURFACES [J].

BARNES, RB ;

BURTON, CJ ;

SCOTT, RG .

JOURNAL OF APPLIED PHYSICS, 1945, 16 (11) :730-739

[2] The electron microscope in metallurgical research [J].

Barrett, CS .

JOURNAL OF APPLIED PHYSICS, 1944, 15 (10) :691-696

[3] PREPARATION OF ELECTRON MICROSCOPE SPECIMENS FOR DETERMINATION OF PARTICLE SIZE DISTRIBUTION IN AQUEOUS SUSPENSIONS [J].

CRAVATH, AM ;

SMITH, AE ;

VINOGRAD, JR ;

WILSON, JN .

JOURNAL OF APPLIED PHYSICS, 1946, 17 (04) :309-310

[4] Mounting of pigments for electron microscopy [J].

Fuller, ML ;

Brubaker, DG ;

Berger, RW .

JOURNAL OF APPLIED PHYSICS, 1944, 15 (02) :201-201

[5]

GEROULD CH, 1944, J DENT RES, V23, P239

[6] Fine structure of metallic surfaces with the electron microscope [J].

Heidenreich, RD ;

Peck, VG .

JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) :23-29

[7] TECHNIQUES IN APPLIED ELECTRON MICROSCOPY [J].

HEIDENREICH, RD .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1945, 35 (02) :139-148

[8] INVESTIGATION OF SECONDARY PHASES IN ALLOYS BY ELECTRON DIFFRACTION AND THE ELECTRON MICROSCOPE [J].

HEIDENREICH, RD ;

STURKEY, L ;

WOODS, HL .

JOURNAL OF APPLIED PHYSICS, 1946, 17 (02) :127-136

[9] Electron microscopic determination of surface elevations and orientations [J].

Heidenreich, RD ;

Matheson, LA .

JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) :423-435

[10]

HEIDENREICH RD, 1945, SAE J T, V53, P588

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