EFFECT OF RADIATION-DAMAGE ON THE METAL-INSULATOR-TRANSITION AND LOW-TEMPERATURE TRANSPORT IN THE TETRAMETHYLTETRASELENOFULVALINIUM PF6 SALT [(TMTSF)2PF6]

被引:79
作者
CHOI, MY [1 ]
CHAIKIN, PM [1 ]
HUANG, SZ [1 ]
HAEN, P [1 ]
ENGLER, EM [1 ]
GREENE, RL [1 ]
机构
[1] IBM CORP,RES LAB,SAN JOSE,CA 95193
来源
PHYSICAL REVIEW B | 1982年 / 25卷 / 10期
关键词
D O I
10.1103/PhysRevB.25.6208
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:6208 / 6217
页数:10
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