Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials

被引：7
作者：
Almasi, D. [1 ,2 ]
Sharifi, R. [3 ]
Kadir, M. R. Abdul [2 ]
Krishnamurithy, G. [4 ]
Kamarul, T. [5 ]
机构：
[1] Islamic Azad Univ, Kermanshah Branch, Young Researchers & Elite Club, Kermanshah, Iran
[2] Univ Teknol Malaysia, Fac Biosci & Med Engn, Med Devices & Technol Grp MEDITEG, Skudai 81310, Johor, Malaysia
[3] Kermanshah Univ Med Sci, Sch Dent, Dept Endodont, Kermanshah, Iran
[4] Univ Liverpool, Inst Translat Med, Sherrington Bldg, Liverpool L69 3GE, Merseyside, England
[5] Univ Malaya, Dept Orthopaed Surg NOCERAL, Fac Med, Kuala Lumpur 50603, Malaysia
来源：
JOURNAL OF ENGINEERING | 2016年 / 2016卷
关键词：
D O I：
10.1155/2016/2456378
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from AFM is slightly different from those obtained from a more typical nanoindentation force curve due to the AFM piezo's hysteresis. In this study the nanomechanical properties of either a sulfonated polyether ether ketone (SPEEK) treated layer or bare polyether ether ketone (PEEK) were evaluated via AFM nanoindentation and a nanomechanical test system to probe the possible error of the calculated nanomechanical properties due to the AFM piezo's hysteresis. The results showed that AFM piezo's hysteresis caused the error in the calculated nanomechanical properties of the materials.
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页数：8
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