ELECTRON MICRODIFFRACTION OF FAULTED REGIONS IN CO-CR AND CO-NI-CR THIN-FILMS

被引:24
作者
HONO, K
DEMCZYK, BG
LAUGHLIN, DE
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D O I
10.1063/1.101915
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O59 [应用物理学];
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页码:229 / 231
页数:3
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