DEPTH SELECTION BY MEANS OF SCATTERED ELECTRONS - METHOD TO DETERMINE ELECTRON LINE PROFILES

被引：20
作者：
BAVERSTAM, U [1 ]
BOHM, C [1 ]
RINGSTROM, B [1 ]
EKDAHL, T [1 ]
机构：
[1] UNIV STOCKHOLM, INST PHYS, STOCKHOLM, SWEDEN
来源：
NUCLEAR INSTRUMENTS & METHODS | 1973年 / 108卷 / 03期
关键词：
D O I：
10.1016/0029-554X(73)90522-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：439 / 443
页数：5
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