MATRIX EFFECTS IN SECONDARY ION EMISSION - QUANTITATIVE-ANALYSIS OF SILICATES

被引:0
作者
HAVETTE, A [1 ]
SLODZIAN, G [1 ]
机构
[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE
来源
COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B | 1980年 / 290卷 / 03期
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中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
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页码:51 / 54
页数:4
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[7]   SOME PROBLEMS ENCOUNTERED IN SECONDARY ION EMISSION APPLIED TO ELEMENTARY ANALYSIS [J].
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