NOVEL AND ACCURATE METHODS FOR MEASURING SMALL-SIGNAL AND LARGE-SIGNAL IMPEDANCES OF IMPATT DIODES

被引:0
作者
VANIPEREN, BB
TJASSENS, H
机构
来源
PHILIPS RESEARCH REPORTS | 1972年 / 27卷 / 01期
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中图分类号
O6 [化学];
学科分类号
0703 ;
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页码:38 / +
页数:1
相关论文
共 21 条
[1]   COMPUTER-AIDED MICROWAVE IMPEDANCE MEASUREMENTS [J].
DALLEY, JE .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1969, MT17 (08) :572-&
[2]   LARGE-SIGNAL SILICON AND GERMANIUM AVALANCHE-DIODE CHARACTERISTICS [J].
DECKER, DR ;
DUNN, CN ;
FRANK, RL .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (11) :872-&
[3]  
DELAGEBEAUDEUF D, 1968, ONDE ELECTR, V48, P722
[4]   COMPUTER-AIDED SMALL-SIGNAL CHARACTERIZATION OF IMPATT DIODES [J].
DUNN, CN ;
DALLEY, JE .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1969, MT17 (09) :691-+
[6]   MOUNTED DIODE EQUIVALENT CIRCUITS [J].
GETSINGER, WJ .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1967, MT15 (11) :650-+
[7]   ACTIVE IMPATT DIODE PARAMETERS OBTAINED BY COMPUTER REDUCTION OF EXPERIMENTAL DATA [J].
GEWARTOWSKI, JW ;
MORRIS, JE .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (03) :157-+
[8]   ADMITTANCE MEASUREMENT OF IMPATT DIODE AT X-BAND [J].
ISOBE, T ;
NAKAMURA, T .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (11) :993-&
[9]   CHARACTERIZATION AND MODELING OF IMPATT OSCILLATORS [J].
KRAMER, NB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1968, ED15 (11) :838-+
[10]  
LOACH BCD, 1964, IEEE T MICROW THEORY, VMT12, P15