DIRECTION-SENSITIVE DISPLACEMENT ANALYSIS BY MULTIPLE FREQUENCY HOLOGRAPHIC-INTERFEROMETRY

被引：4

作者：

HOLLOWAY, DC ^{[1
]}

PATACCA, AM ^{[1
]}

FOURNEY, WL ^{[1
]}

机构：

[1] WESTINGHOUSE ELECT CORP,CTR DEF & ELECTR SYST,BALTIMORE,MD 21203

来源：

APPLIED OPTICS | 1978年 / 17卷 / 08期

关键词：

D O I：

10.1364/AO.17.001213

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1213 / 1219

页数：7

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